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Jeol jem 2100 lab6 tem Analytical TEM The JEM-2100 (LaB6) TEM is a multipurpose, analytical electron microscope, and provides solutions for a wide range of problems in the fields of materials sciences, nanosciences, and biological sciences. JEOL JEM-ARM200F Cs Corrected S/TEM With advanced analytical capabilities, the JEM-ARM200F enables atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy).

'NEOARM' / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.

'NEOARM' is also equipped with an automated aberration correction system COSMO that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.

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Contrast enhancement of light elements is achieved by a new STEM imaging technique (e-ABF: enhanced ABF), facilitating observation of light-element materials, even at low accelerating voltages. The microscope room is separated from the operation room to enable straightforward remote operation. In addition, JEOL products’ new concept colors of 'pure white' and 'JEOL silver' are adopted, leading to a sophisticated exterior design of 'NEOARM'.

Spherical aberration (Cs) corrector ASCOR (Advanced STEM Corrector) ASCOR incorporated in 'NEOARM' can suppress the six-fold astigmatism which limits resolution after Cs correction. The combination of ASCOR and Cold FEG gives low chromatic aberration and expands the diffraction limit, achieving higher resolution than ever. Automatic aberration correction software JEOL COSMO™ (Corrector System Module) JEOL COSMO™ adopts a new aberration correction algorithm (SRAM: Segmented Ronchigram Auto-correlation function Matrix). Thus, no special sample is required for aberration correction, leading to high-precision and quick correction of higher order aberrations. This system enables fast processing compared to the conventional correction algorithm and also automates the operations, thus eliminating a complicated correction workflow in the microscope.

These features enable higher-throughput atomic-resolution imaging. New ABF (Annular Bright Field) detector system The ABF detector is widely used as a technique suitable for high-resolution imaging of light elements. 'NEOARM' supports enhanced contrast of light elements by a newly-designed ABF imaging technique (e-ABF：enhanced ABF). This capability facilitates atomic-level structure observation of materials containing light elements. Perfect sight detector The perfect sight detector, integrated into 'NEOARM', uses hybrid scintillators. This detector always enables the acquisition of high-contrast and quantitative STEM images, irrespective of accelerating voltage settings. Viewing Camera system 'NEOARM' comes with the Viewing Camera system.

This image observation system uses a dual camera, intended to be used for remote operations. Thus, the system allows for the remote operations in a room separated from the microscope room and also enables a flexible operation environment. Disclosure of personal data to third partiesThis website uses services that collect personal data in order to provide social media features and to analyse our traffic. These services include Google Maps (for the display of our location) and Google Analytics (for local website analysis). These integrated services might merge the personal data with further data.

Manualidades Gratis

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